芯片老化测试 解决方案供应商
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GLS通用器件老化测试系统
GLS General Device Aging Testing System
GLP功率器件老化测试系统
GLP Power Device Aging Testing System
GLP量产老化测试系统
GLP mass-produced burn in testing system
老化板上下料分选机(BIB装载机)
Aging board loading and unloading sorting machine (BIB loader)
老化测试–浴缸曲线
Aging test - bathtub curve
老化测试板
Aging test board
毫不妥协的测试
Uncompromising testing
封装/模块部件老化
Aging of packaging/module components
SiC MOSFET参数和应力测试
SiC MOSFET parameters and stress testing
测试探针
Test probe
测试插座
Test socket
OEM芯片测试烧录解决方案
OEM chip testing and burning solution
案例+专案定制
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